By Gabby Chen

(JW Insights) Feb 23 -- Gazer Semi (盖泽半导体), a Chinese semiconductor equipment manufacturer, announced that it delivered its first self-developed equipment GS-M06Y for detecting the thickness of silicon carbide (SiC) epitaxial layer.

Founded in 2016, the Shanghai-based Gazer Semi provides high-precision optical inspection equipment for wafer products. Its business covers semiconductor, photovoltaic and LCD sectors. The company has its own R&D center and manufacturing plant.

Its GS-M06Y adopts Gazer's self-developed technologies including high precision algorithm, Load Port, control software and FTIR optical path system. The company's FTIR system ensures quick detection of wafer thickness, realizing fast scanning speed and high resolution and sensitivity.

It is worth mentioning that Gazer's products, compared with international brands, have two major advantages: stronger compatibility with customized services and shorter measurement time with higher accuracy.

Now Chinese measuring equipment has a low domestic manufacturing rate due to international giants like KLA, Applied Materials, and Hitachi High-Tech having shaped their monopolistic advantages. In addition, FTIR wafer measuring equipment also mostly relies on imports in the segmented field, said the JW Insights report.