CN
Chinese semiconductor equipment provider Gazer Semi delivers its first home-made equipment for detecting SiC epitaxial layer thickness
Chinese article by 张杰
English Editor 张未名
02-23 15:39
Gazer Semi (盖泽半导体) announced that it delivered its first self-developed equipment GS-M06Y for detecting the thickness of silicon carbide (SiC) epitaxial layer.
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